## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

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Page 45

It is then

It is then

**important**to use at least six y tilts in a measurement at both +4 , and -4 . The Marion - Cohen method appears to be a practical procedure for separating the macrostress and the range of d spacings present due to ...Page 103

An area fraction modified by absorption is of

An area fraction modified by absorption is of

**importance**for determining the various effective volumes and therefore the ... Preliminary calculations like those given in Tables I and II are**important**to assess the feasibility of x - ray ...Page 104

These are known to have an

These are known to have an

**important**, if not a dominant , effect on the volume diffusion coefficient ( Balluffi and Blakely , 1975 ) . Eliminating defect structure data from a diffusion study of films would eliminate an essential part ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray